Applications of Auger electron spectrometer in material analysis
scanning Auger electron spectroscopy
The simulation of the Auger electron emissions in scanning probe electron energy spectrometer (SPEES) is reported.
Auger electron spectroscopy (AES) and X ray photoelectron spectroscopy (XPS) are employed to study the synergistic mechanism.
Auger electron Spectrscopy (AES) has widespread use in determining the chemical and electronic structure of solid surface (40a).