television test pattern generator
An automatic test pattern generation (ATPG) algorithm for deliberately selected delay faults is presented to cope with the crosstalk-induced delay effects on longer paths.
As I proceed with the examples, I'll highlight whether a given test pattern verifies the crosscutting functionality, the specification, or both.
For all benchmark circuits, the method is able to encode all deterministic test patterns using an LFSR whose size is equal to the maximum number of care bits in a test pattern.
test pattern generation program
test pattern generation system